RI-SAR: Randomized Input SAR ADC Resilient to Power Side Channel Attacks
2023 IEEE Physical Assurance and Inspection of Electronics (PAINE), 2023
Recommended citation: Sumanth Karanth, Sirish Oruganti, Meizhi Wang, Jaydeep Kulkarni, "RI-SAR: Randomized Input SAR ADC Resilient to Power Side Channel Attacks." 2023 IEEE Physical Assurance and Inspection of Electronics (PAINE), 2023.
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