Fine-Grained Electromagnetic Side-Channel Analysis Resilient Secure AES Core with Stacked Voltage Domains and Spatio-temporally Randomized Circuit Blocks

ESSCIRC 2022-IEEE 48th European Solid State Circuits Conference (ESSCIRC), 2022

Recommended citation: Meizhi Wang*, Sirish Oruganti*, Shanshan Xie, Raghavan Kumar, Sanu Mathew, Jaydeep Kulkarni, "Fine-Grained Electromagnetic Side-Channel Analysis Resilient Secure AES Core with Stacked Voltage Domains and Spatio-temporally Randomized Circuit Blocks." ESSCIRC 2022-IEEE 48th European Solid State Circuits Conference (ESSCIRC), 2022.